Speaker
Description
The increasing number of in vivo investigations combining non- invasive brain stimulation (NIBS) techniques – such as transcranial electric (tES) stimulation – with invasive stimulation (e.g., DBS) or sensing electrodes (e.g., sEEG), requires a proper understanding of the mechanisms of interaction between applied fields and passive/active implants to determine safety. In view of allowing personalized stimulation strategies and inform safety decisions, dedicated safety metrics and efficient computational strategies need to be identified. In this dosimetric study, we systematically analyzed exposure conditions and a range of interaction mechanisms with the aim of establishing worst case exposure conditions (WCE), identifying conservative exposure thresholds and safe electrode placement strategies.
